The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2017
Filed:
Feb. 12, 2014
Texas Instruments Incorporated, Dallas, TX (US);
Adesh Sontakke, Karnataka, IN;
Rajesh Kumar Mittal, Karnataka, IN;
Rubin A. Parekhji, Karnataka, IN;
Upendra Narayan Tripathi, Karnataka, IN;
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
A testable integrated circuit chip () includes a functional circuit () having modules (IP.i), a storage circuit () operable to hold a table representing sets of compatible tests that are compatible for concurrence, and an on-chip test controller () coupled with the storage circuit () and with the functional circuit modules (IP.i. The test controller () is operable to dynamically schedule and trigger the tests in those sets, which promotes concurrent execution of tests in the functional circuit modules (IP.i). Other circuits, wireless chips, systems, and processes of operation and processes of manufacture are disclosed.