The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2017

Filed:

Oct. 27, 2015
Applicant:

Xilinx, Inc., San Jose, CA (US);

Inventors:

Graham F. Schelle, Longmont, CO (US);

Yi-Hua E. Yang, San Jose, CA (US);

Paul R. Schumacher, Berthoud, CO (US);

Patrick Lysaght, Los Gatos, CA (US);

Assignee:

XILINX, INC., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G01R 31/317 (2006.01); G01R 31/3177 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31703 (2013.01); G01R 31/3177 (2013.01);
Abstract

Methods and circuits are disclosed for testing a partial circuit design including circuit modules having a set of ports configured to be driven by signals from ports of one or more circuits omitted from the partial circuit. The set of ports are identified by identifying ports that are not connected by a net to another port or input/output (I/O) pin in the circuit design and that form inputs to slave circuits in the circuit modules. A traffic generator circuit is added to the partial design to form a test circuit design. The traffic generator circuit is configured to provide to the set of ports respective input data signals having a pattern consistent with master-to-slave communication. Operation of a test circuit design is modeled. A set of data signals generated by the circuit modules during the modeled operation of the test circuit design is captured and stored.


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