The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2017

Filed:

Sep. 27, 2012
Applicant:

Sysmex Corporation, Kobe-shi, Hyogo, JP;

Inventors:

Makoto Ueda, Hyogo, JP;

Yuji Wakamiya, Kushiro, JP;

Toshikatsu Fukuju, Akashi, JP;

Kazunori Mototsu, Kobe, JP;

Assignee:

Sysmex Corporation, Hyogo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/566 (2006.01); C12Q 1/70 (2006.01); C12M 1/34 (2006.01); G01N 33/50 (2006.01); G01N 35/00 (2006.01); G01N 35/02 (2006.01); G01N 35/04 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00623 (2013.01); G01N 35/026 (2013.01); G01N 2035/0415 (2013.01);
Abstract

A sample analyzer transports a first rack and a second rack, the first rack including a first number of supporters for supporting containers that contain biological samples of subjects, and the second rack including a second number of supporters for supporting containers that contain standard samples. The sample analyzer determines whether a transport object is the first rack or the second rack. When it has been determined that the transport object is the second rack, the sample analyzer performs a transporting operation according to the second rack and measure the standard samples in the containers supported by the second rack in a predetermined order, and prepares a calibration curve used for analyzing a measurement result of a biological sample, based on a plurality of measurement results of the standard samples.


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