The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2017
Filed:
Jul. 17, 2015
Industrial Optical Measurement Systems, Ann Arbor, MI (US);
Stephen Barrett Segall, Ann Arbor, MI (US);
Industrial Optical Measurement Systems, LLC, Ann Arbor, MI (US);
Abstract
A non-contact optical probe for inspecting an inside surface of a cylindrical workpiece includes a laser source that emits an incident light beam, a polarizing beam splitter that transmits one polarization of the incident beam and reflects the opposite polarization, and a quarter wave plate that together with the polarizing beam splitter separates back reflected return light from the incident laser beam. The non-contact optical probe further includes an optical system that directs the incident laser beam onto the cylinder surface and directs reflected light from the surface back to the beam splitter, and at least one detector that receives a portion of the reflected light and generates data about the cylinder surface.