The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2017

Filed:

Sep. 23, 2013
Applicant:

GE Healthcare Bio-sciences Corp., Piscataway, NJ (US);

Inventors:

Jeremy Cooper, Issaquah, WA (US);

William M. Dougherty, Issaquah, WA (US);

Assignee:

GE HEALTHCARE BIO-SCIENCES CORP., Marlborough, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G02B 21/14 (2006.01); G02B 21/16 (2006.01); G02B 21/36 (2006.01); G01B 11/00 (2006.01); G02B 21/06 (2006.01); G02B 27/58 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6458 (2013.01); G01B 11/002 (2013.01); G01N 21/6486 (2013.01); G02B 21/06 (2013.01); G02B 21/14 (2013.01); G02B 21/16 (2013.01); G02B 21/361 (2013.01); G02B 21/365 (2013.01); G02B 21/367 (2013.01); G02B 27/58 (2013.01); G01N 2201/0633 (2013.01); G01N 2201/0636 (2013.01);
Abstract

Methods and systems to resolve positions of sample components in fluorescence stochastic microscopy using three-dimensional structured illumination microscopy ('3D-SIM') are disclosed. In one aspect, components of a sample specimen are labeled with fluorophores and weakly illuminated with a frequency of light to stochastically convert a subset of the fluorophores into an active state. The sample is then illuminated with a three-dimensional structured illumination pattern ('3D-SIP') of excitation light that causes the activated fluorophores to fluoresce. As the 3D-SIP is incrementally moved within the volume of the sample and images are recorded, computational methods are used to process the images to locate and refine the locations of the activated fluorophores thereby generating a super-resolution image of sample components.


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