The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2017

Filed:

Mar. 19, 2012
Applicants:

Winfried Mayer, Buch, DE;

Manfred Eckert, Todtnau, DE;

Inventors:

Winfried Mayer, Buch, DE;

Manfred Eckert, Todtnau, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F 23/284 (2006.01); G01F 25/00 (2006.01);
U.S. Cl.
CPC ...
G01F 23/284 (2013.01); G01F 25/0061 (2013.01); G01F 25/0076 (2013.01);
Abstract

A method is based on measuring a distance to a reference reflector arranged at a known distance, in order to calibrate and/or monitor a coherent frequency modulation, continuous wave radar, fill-level measuring device, wherein the reference reflector can be reliably identified. To this end, a reference reflector executing oscillations toward the fill-level measuring device with an oscillation frequency is used, which is inserted in the beam path of periodically linearly frequency modulated transmission signals transmitted from the fill-level measuring device. The fill-level measuring device receives fractions of the transmission signals reflected back on reflectors in the container and records based on these received signals and their time correlation relative to the respectively associated transmission signal for each received signal an echo function, which shows the amplitudes of the received signal as a function of the associated position of the associated reflector. Based on the time change of a plurality of sequentially recorded echo functions and the oscillation frequency of the reference reflector, the position of the reference reflector in the echo functions is identified and its reference reflector position determined.


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