The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2017
Filed:
Jun. 30, 2015
National Taiwan University of Science and Technology, Taipei, TW;
Jeng-Ywan Jeng, Taipei, TW;
Mohammad Hossein Goudarzi Khouygani, Taipei, TW;
Meng-Jyun Lin, Taipei, TW;
NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY, Taipei, TW;
Abstract
An apparatus for measuring pattern of a grating device is provided. In an embodiment, the apparatus comprises a light source unit, an image unit, a processing unit, and a movement unit. The light source unit irradiates to a surface of the grating device. The image unit acquires a plurality of first digital images including an image on the surface of the grating device and images due to Talbot effect between the surface and a first position with respect to the grating device. The image unit acquires a plurality of second digital images due to Talbot effect at a second position determined based on the first digital images when the movement unit produces a relative movement between the image unit and grating device. Based on the acquired digital images, analysis, inspection on the grating device, or comparison of the grating device with a reference grating scale, can be implemented optionally.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile