The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2017

Filed:

Feb. 11, 2014
Applicant:

Rec Silicon Inc, Moses Lake, WA (US);

Inventors:

Sefa Yilmaz, Moses Lake, WA (US);

Theodore F. Ciszek, Evergreen, CO (US);

Matthew J. Miller, Moses Lake, WA (US);

Stein Julsrud, Moses Lake, WA (US);

Assignee:

REC Silicon Inc, Moses Lake, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C01B 33/021 (2006.01); G01N 21/3563 (2014.01); C01B 33/037 (2006.01); C01B 33/02 (2006.01); C01B 33/035 (2006.01); C01B 31/14 (2006.01); G01N 21/35 (2014.01);
U.S. Cl.
CPC ...
C01B 33/021 (2013.01); C01B 31/14 (2013.01); C01B 33/02 (2013.01); C01B 33/035 (2013.01); C01B 33/037 (2013.01); G01N 21/3563 (2013.01); G01N 2021/3595 (2013.01);
Abstract

Apparatus and methods for consolidating granular silicon and determining trace elements content of the consolidated silicon are disclosed. Silicon granules are placed in a vessel, and a silicon slug of known purity is embedded at least partially in the granules. The slug is preheated to a temperature sufficient to couple with an induction heater. As the silicon slug melts, silicon granules adjacent the molten silicon also melt. The vessel passes through an induction coil to successively inductively heat and melt regions of the silicon granules from the leading end to the trailing end with each region solidifying as the molten silicon exits the induction coil to provide a multicrystalline silicon ingot. The multicrystalline silicon ingot is sliced into wafers, which are analyzed by low-temperature Fourier transform infrared spectroscopy to determine levels of trace elements in the ingot.


Find Patent Forward Citations

Loading…