The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2017
Filed:
Oct. 02, 2012
Analogic Corporation, Peabody, MA (US);
Guy M. Besson, Peabody, MA (US);
Charles Shaughnessy, Hamilton, MA (US);
Douglas Abraham, Topsfield, MA (US);
Analogic Corporation, Peabody, MA (US);
Abstract
Among other things, one or more techniques and/or systems are described for measuring the attenuation of a line integral through an object via a photon counting cell () and via an energy integrating cell (). That is, an imaging apparatus is provided that comprises a radiation source () and a detector array (). The detector array is comprised of both photon counting cells () and energy integrating cells () arranged such that, during an examination of the object, attenuation of a line integral through the object is measured by at least one photon counting cell and at least one energy integrating cell. In this way, at least two substantially complete views of an object may be acquired, one from measurements yielded from the photon counting cell (and other photon counting cells) and one from measurements yielded from the energy integrating cell (and other energy integrating cells).