The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2017

Filed:

Jul. 23, 2014
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Jae Hak Lee, Yongin-si, KR;

Dong Goo Kang, Hwaseong-si, KR;

Sung Hoon Kang, Suwon-si, KR;

Young Hun Sung, Hwaseong-si, KR;

Seok Min Han, Seongnam-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 6/03 (2006.01); A61B 6/02 (2006.01);
U.S. Cl.
CPC ...
A61B 6/022 (2013.01); A61B 6/4007 (2013.01); A61B 6/032 (2013.01); A61B 6/4441 (2013.01);
Abstract

Disclosed herein is an X-ray imaging apparatus including: an X-ray generator including a first X-ray source configured to irradiate a first X-ray onto an object, and at least one second X-ray source spaced apart from the first X-ray source and configured to irradiate at least one second X-ray onto the object; an X-ray detector configured to detect the first X-ray which has propagated through the object and the at least one second X-ray which has propagated through the object; and an image processor configured to produce a first X-ray image of the object based on the detected first X-ray, to produce at least one second X-ray image of the object based on the detected at least one second X-ray, and to produce a stereoscopic image of the object based on the first X-ray image and the at least one second X-ray image.


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