The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2017

Filed:

Jun. 09, 2011
Applicants:

Giorgio Bonmassar, Lexington, MA (US);

John William Belliveau, Boston, MA (US);

Inventors:

Giorgio Bonmassar, Lexington, MA (US);

John William Belliveau, Boston, MA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/02 (2006.01); A61B 5/0476 (2006.01); A61B 5/053 (2006.01); A61B 5/055 (2006.01);
U.S. Cl.
CPC ...
A61B 5/02007 (2013.01); A61B 5/0476 (2013.01); A61B 5/053 (2013.01); A61B 5/055 (2013.01); A61B 5/0536 (2013.01);
Abstract

A system for detecting abnormalities or inconsistencies and a method to utilize the same are provided. In particular, a computer system may be adapted to detect the abnormality or inconsistency within at least a portion of a subject by generating internal impedance data which indicates that an impedance change within the portion of the subject has occurred. For example, the impedance change may be associated with a change in at least one characteristic of a blood vessel within the subject (such as a change in a fluid flow rate within at least a portion of the subject), a change in a fluid volume within at least a portion of the subject, etc. The impedance change also may be associated with the presence of a foreign object within the portion of the subject. In an exemplary embodiment, it is possible to detect the abnormality or inconsistency within the subject by generating a continuous, real time internal impedance map indicating the impedance change within the subject. Alternatively, the abnormality or inconsistency may be detected within the subject by generating a plurality of static internal impedance maps which indicate that the impedance change within the subject has occurred.


Find Patent Forward Citations

Loading…