The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2017
Filed:
Nov. 01, 2013
Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;
Hyoung-Youl Yu, Seoul, KR;
Youn-Sun Kim, Seongnam-si, KR;
Hyo-Jin Lee, Seoul, KR;
Hyoung-Ju Ji, Seoul, KR;
Ju-Ho Lee, Suwon-si, KR;
Seung-Hoon Choi, Suwon-si, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
A method and a device for measuring interference in a communication system are provided. The method includes measuring interference in a base station of a communication system, in which one or more antenna groups are arranged at different positions in a single cell, includes the steps of determining a reception antenna group which is one of the one or more antenna groups that transmits a signal other than an interference signal to a terminal, determining a reference signal in order to measure the strength of the signal transmitted by the reception antenna group, a step of determining a wireless resource so as to measure the interference in each of the one or more antenna groups, and notifying the terminal with the strength of the signal transmitted by the reception antenna group and information for measuring the interference in each of the one or more antenna groups.