The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2017
Filed:
Dec. 15, 2014
Applicant:
Marvell International Ltd., Hamilton, BM;
Inventor:
Huai Dong Li, Cupertino, CA (US);
Assignee:
Marvell International Ltd., , BM;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 17/00 (2006.01); H04N 9/04 (2006.01); H04N 9/64 (2006.01); H04N 9/73 (2006.01);
U.S. Cl.
CPC ...
H04N 17/002 (2013.01);
Abstract
Apparatus, methods, and other embodiments associated with correcting defects in an image sensor output are described. According to one embodiment, an imaging device includes image sensor array logic, calibrated noise logic, and defect logic. The image sensor array logic is configured to generate an image array of output pixels in a Bayer pattern. The calibrated noise logic is configured to generate a noise estimate for each pixel. The defect logic is configured to detect a potential defect in a pixel-under-test of the image array of output pixels based on the noise estimate.