The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2017
Filed:
Dec. 15, 2014
Wistron Corporation, New Taipei, TW;
Pen-Tai Miao, New Taipei, TW;
Ping-Hung Chen, New Taipei, TW;
Shih-Ming Hsu, New Taipei, TW;
Li-Yu Yang, New Taipei, TW;
WISTRON CORPORATION, New Taipei, TW;
Abstract
A method for judging in a 3D environment includes: receiving a first image and a second image of a displayed 3D image, the first image being captured without the aid of 3D glasses, the second image being captured with the 3D glasses arranged in front of an image capturing unit; processing each of the first and second images so as to obtain a respective one of a processed first image and a processed second image; and determining whether a number of enclosed areas contained in the processed first image is equal to a predetermined value, and whether a number of enclosed areas contained in the processed second image is equal to another predetermined value. The 3D environment is normal when results of determinations are affirmative.