The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2017
Filed:
Feb. 18, 2015
Samsung Electronics Co., Ltd., Suwon-si, KR;
Dongguk University Industry-academic Cooperation Foundation, Seoul, KR;
Dae-Yun Kim, Seoul, KR;
Min-Kyu Song, Seoul, KR;
Yeon-Seong Hwang, Incheon, KR;
Jae-Jung Park, Hwaseong-si, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Dongguk University Industry-Academic Cooperation Foundation, Seoul, KR;
Abstract
Provided are a ramp signal calibration apparatus and method and image sensor including the apparatus. The apparatus includes: an analog-to-digital converter (ADC) including a trimmable transistor having a gain value that varies according to stored data, and configured to receive a ramp signal in a state where the gain value is a first gain value, and to output first and second output signals; a subtractor configured to calculate a difference between the first and second output signals; a digital comparator configured to compare the difference with a reference value and to determine whether a slope of the ramp signal has changed; and a counter configured to change the stored data based on whether the slope of the ramp signal has changed, wherein when the counter changes the data, the first gain value of the trimmable transistor is changed to a second gain value according to the changed data.