The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2017
Filed:
Jan. 06, 2015
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventor:
Kanako Dowaki, Tokyo, JP;
Assignee:
CANON KABUSHIKI KAISHA, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/347 (2011.01); H04N 5/361 (2011.01); H04N 5/32 (2006.01); G01T 1/24 (2006.01); H04N 5/343 (2011.01); H04N 5/345 (2011.01); H04N 5/355 (2011.01);
U.S. Cl.
CPC ...
H04N 5/32 (2013.01); G01T 1/247 (2013.01); H04N 5/343 (2013.01); H04N 5/3456 (2013.01); H04N 5/3559 (2013.01);
Abstract
A radiation imaging apparatus, comprising a plurality of sensors, a holding unit configured to hold a signal level of each sensor, a monitor unit configured to monitor the signal levels, and a control unit configured to control each sensor so as to detect radiation with a first sensitivity and a second sensitivity higher than the first sensitivity, wherein the control unit performs first control to cause the monitor unit to monitor signal levels with the second sensitivity, and performs second control to select some sensors out of the plurality of sensors based on monitoring results obtained in the first control.