The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2017

Filed:

Feb. 08, 2016
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Kenji Komine, Chigasaki, JP;

Go Yamashita, Ina, JP;

Takumi Suzuki, Minowa, JP;

Wataru Ikegami, Ina, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03B 5/32 (2006.01); H01L 41/053 (2006.01); H03H 9/05 (2006.01); H03H 9/19 (2006.01); H01L 41/09 (2006.01);
U.S. Cl.
CPC ...
H03B 5/32 (2013.01); H01L 41/053 (2013.01); H01L 41/094 (2013.01); H01L 41/0913 (2013.01); H03H 9/0538 (2013.01); H03H 9/19 (2013.01);
Abstract

A resonator includes: a resonator element including a quartz crystal substrate that includes a first area performing a thickness-shear vibration and a second area with a thickness thinner than the first area and located around the first area; and a base substrate to which the second area of the resonator element on one edge side thereof is attached via a bonding material. The quartz crystal substrate has a major surface that is a surface including an X-axis and a Z'-axis, and has a thickness in a direction along a Y′-axis. The resonator satisfies the relation: 1.5×λ≦Xp where Xp is the maximum length of an area of the second area where the bonding material is bonded along the X-axis in a plan view and λ is the wavelength of a flexural vibration occurring in the quartz crystal substrate.


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