The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2017

Filed:

Feb. 26, 2015
Applicant:

Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;

Inventors:

Masao Uchida, Osaka, JP;

Masashi Hayashi, Osaka, JP;

Koutarou Tanaka, Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/15 (2006.01); H01L 29/16 (2006.01); H01L 29/66 (2006.01); H01L 29/872 (2006.01); H01L 29/47 (2006.01); H01L 21/04 (2006.01); H01L 29/06 (2006.01); H01L 29/78 (2006.01); H01L 29/45 (2006.01); H01L 29/423 (2006.01);
U.S. Cl.
CPC ...
H01L 29/1608 (2013.01); H01L 21/0485 (2013.01); H01L 21/0495 (2013.01); H01L 29/0619 (2013.01); H01L 29/0692 (2013.01); H01L 29/47 (2013.01); H01L 29/6606 (2013.01); H01L 29/66068 (2013.01); H01L 29/7806 (2013.01); H01L 29/7811 (2013.01); H01L 29/7828 (2013.01); H01L 29/872 (2013.01); H01L 29/423 (2013.01); H01L 29/45 (2013.01);
Abstract

A semiconductor device includes first and second second-conductivity-type region groups containing multiple second-conductivity-type regions that are disposed on a first silicon carbide semiconductor layer of a first conductivity type, arrayed in parallel following one direction with a space between each other, and first and second electrodes disposed on the first silicon carbide semiconductor layer and forming a Schottky junction with the first silicon carbide semiconductor layer. The first electrode covers a position where a distance from adjacent first and second second-conductivity-type regions included in a first second-conductivity-type region group, and a distance from a third second-conductivity-type region included in a second second-conductivity-type region group and adjacent to the first and second second-conductivity-type regions, are equal. A Schottky barrier between the first electrode and the first silicon carbide semiconductor layer is larger than a Schottky barrier between the second electrode and the first silicon carbide semiconductor layer.


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