The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2017

Filed:

Jun. 21, 2016
Applicant:

SK Hynix Inc., Icheon-si Gyeonggi-do, KR;

Inventor:

Joo Hyeon Lee, Bucheon-si, KR;

Assignee:

SK HYNIX INC., Icheon-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 7/00 (2006.01); G11C 29/04 (2006.01); G11C 7/10 (2006.01); G11C 8/10 (2006.01); G11C 17/16 (2006.01); G11C 17/18 (2006.01); G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
G11C 29/04 (2013.01); G11C 7/10 (2013.01); G11C 8/10 (2013.01); G11C 17/16 (2013.01); G11C 17/18 (2013.01); G11C 29/78 (2013.01);
Abstract

A semiconductor device may be provided. The semiconductor device may include a failure information generation circuit configured to generate first failure information. The semiconductor device may include a first latch data generation circuit configured to include the first failure information into first latch data of a first block and configured to output the first latch data including the first failure information. The semiconductor device may include a data synthesis circuit configured to generate first synthesis data.


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