The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2017
Filed:
Oct. 22, 2010
Michaël Aupetit, Puteaux, FR;
Sylvain Lespinats, Paris, FR;
Michaël Aupetit, Puteaux, FR;
Sylvain Lespinats, Paris, FR;
Abstract
A method and a system for evaluating the class of a test datum in a data space of dimension D where D≧3, each datum belonging to at least one class grouping together several data, comprising: projecting a suite of reference data of the data space into a space of dimension Q where Q<D, the class of each reference datum being known, calculating a measurement of similarity of the test datum to each of the reference data, partitioning the projection space into a plurality of disjoint regions each containing the projection of one and only one reference datum, and finally evaluating the class of the test datum, this class being evaluated as being the same class as one of the reference data contained in one of the regions containing the reference data closest to the test datum in the sense of the similarity measurement.