The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2017
Filed:
Jul. 10, 2013
California Institute of Technology, Pasadena, CA (US);
Lawrence C. Sparks, La Crescenta, CA (US);
Anthony J. Mannucci, Pasadena, CA (US);
Attila Komjathy, La Crescenta, CA (US);
California Institute of Technology, Pasadena, CA (US);
Abstract
A method, system, apparatus, and computer program product provide the ability to analyze ionospheric slant total electron content (TEC) using global navigation satellite systems (GNSS)-based estimation. Slant TEC is estimated for a given set of raypath geometries by fitting historical GNSS data to a specified delay model. The accuracy of the specified delay model is estimated by computing delay estimate residuals and plotting a behavior of the delay estimate residuals. An ionospheric threat model is computed based on the specified delay model. Ionospheric grid delays (IGDs) and grid ionospheric vertical errors (GIVEs) are computed based on the ionospheric threat model.