The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2017
Filed:
Feb. 08, 2016
International Business Machines Corporation, Armonk, NY (US);
Charu Aggarwal, Yorktowne Heights, NY (US);
Yanjie Fu, Newark, NJ (US);
Srinivasan Parthasarathy, Yonkers, NY (US);
Deepak Turaga, Elmsford, NY (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
An automated outlier detection system implements an unsupervised set of processes to determine feature subspaces from a dataset; determine candidate exploratory actions, where each candidate exploratory action is a specific combination of a feature subspace and a parameterized instance of an outlier detection algorithm; and identify a set of optimal exploratory actions to recommend for execution on the dataset from among the candidate exploratory actions. Outlier scores obtained as a result of execution of the set of optimal exploratory actions are processed to obtain one or more outlier views such that each outlier view represents a consistent characterization of outliers by each optimal exploratory action corresponding to that outlier view.