Detecting single event upsets and stuck-at faults in ram-based data path controllers

Abstract

In one embodiment, a system includes a processor and logic configured to receive data including a plurality of data elements, each data element having one or more bits, and pass each data element along with a corresponding parity bit to an input of a data path, a first binary sequence generator configured to create a binary sequence having a plurality of bonus bits, wherein a total length of the binary sequence is equal to or greater than a maximum burst size of the data, and a first parity module configured to provide a parity calculation using bits of each data element of the data with a bonus bit from the binary sequence to produce a parity bit for each data element. Other systems, methods, and computer program products for providing end-to-end parity generation and checking that the scheme provides coverage for both data and sequencing faults are also disclosed.