The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2017

Filed:

Aug. 28, 2015
Applicant:

SK Hynix Inc., Gyeonggi-do, KR;

Inventor:

Myeong-Woon Jeon, Gyeonggi-do, KR;

Assignee:

SK Hynix Inc., Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); H03M 13/00 (2006.01); G11C 29/52 (2006.01); H03M 13/45 (2006.01); H03M 13/11 (2006.01); H03M 13/37 (2006.01); H03M 13/15 (2006.01); H03M 13/23 (2006.01); H03M 13/29 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1068 (2013.01); G11C 29/52 (2013.01); H03M 13/1111 (2013.01); H03M 13/3723 (2013.01); H03M 13/45 (2013.01); H03M 13/6325 (2013.01); H03M 13/152 (2013.01); H03M 13/1515 (2013.01); H03M 13/23 (2013.01); H03M 13/2957 (2013.01);
Abstract

An operating method of a memory controller includes performing a soft read operation to read data stored in a semiconductor memory device using a soft read voltage, performing a soft decision ECC decoding operation to the read data based on a first log likelihood ratio (LLR) value, and performing the soft decision ECC decoding operation to the read data based on a second LLR value when the soft decision ECC decoding operation based on the first LLR value fails. The first and second LLR values are selected between a default LLR value and an updated LLR value. The updated LLR value is generated on a basis of numbers of error bits and non-error bits of the read data, which are obtained through the soft decision ECC decoding operation to the read data.


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