The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2017
Filed:
Jul. 08, 2015
Cisco Technology, Inc., San Jose, CA (US);
Amit Agarwal, San Jose, CA (US);
Debojyoti Dutta, Santa Clara, CA (US);
Johnu George, San Jose, CA (US);
Manoj Sharma, Sunnyvale, CA (US);
Kai Zhang, San Jose, CA (US);
Marc Solanas Tarre, San Jose, CA (US);
Aparupa Das Gupta, San Jose, CA (US);
Yathiraj B. Udupi, San Jose, CA (US);
Seth Mason, Sunnyvale, CA (US);
CISCO TECHNOLOGY, INC., San Jose, CA (US);
Abstract
A method for assisting evaluation of anomalies in a distributed storage system is disclosed. The method includes a step of monitoring at least one system metric of the distributed storage system. The method further includes steps of maintaining a listing of patterns of the monitored system metric comprising patterns which previously did not result in a failure within one or more nodes of the distributed storage system, and, based on the monitoring, identifying a pattern (i.e., a time series motif) of the monitored system metric as a potential anomaly in the distributed storage system. The method also includes steps of automatically (i.e. without user input) performing a similarity search to determine whether the identified pattern satisfies one or more predefined similarity criteria with at least one pattern of the listing, and, upon positive determination, excepting the identified pattern from being identified as the potential anomaly.