The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2017
Filed:
Jul. 11, 2014
Canon Kabushiki Kaisha, Tokyo, JP;
Masayasu Teramura, Utsunomiya, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
Provided is an optical scanning apparatus which can achieve high resolution while reducing detection errors in the synchronous detection of a plurality of light fluxes by temperature fluctuations. An optical scanning apparatus according to this invention includes a light source having a plurality of light-emitting points, a deflection unit configured to deflect a plurality of light fluxes emitted by the plurality of light-emitting points, a scanning optical system configured to guide the plurality of light fluxes deflected by the deflection unit onto a scanned surface, and a synchronous detection unit configured to detect light fluxes from at least two light-emitting points of the plurality of light-emitting points. The synchronous detection unit includes a plurality of imaging elements. The first imaging element, of the plurality of imaging elements, which exhibits the smallest change in refractive index with respect to temperatures has the largest refractive power in a main scanning section.