The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2017
Filed:
Mar. 21, 2013
Applicant:
Huron Technologies International Inc., Waterloo, CA;
Inventors:
Arthur Edward Dixon, Waterloo, CA;
Savvas Damaskinos, Kitchener, CA;
Assignee:
Huron Technologies International Inc., Waterloo, ON, CA;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G02B 21/26 (2006.01); G02B 21/00 (2006.01); G02B 21/12 (2006.01); G02B 21/16 (2006.01);
U.S. Cl.
CPC ...
G02B 21/365 (2013.01); G02B 21/006 (2013.01); G02B 21/008 (2013.01); G02B 21/0076 (2013.01); G02B 21/26 (2013.01); G02B 21/12 (2013.01); G02B 21/16 (2013.01);
Abstract
An instrument and method for scanning large microscope specimen on a specimen holder has a scanning optical microscope that is configured to scan the specimen in one of brightfield and fluorescence. The specimen is dynamically tillable about a scan direction during a scan to maintain focus along the length of each scan line as the scan proceeds. A three dimensional image of the specimen can be obtained wherein the specimen tilt and relative focus are maintained from a first image contour to a second image contour through a thickness of a specimen.