The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9575303 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 21, 2017

Filed:

May. 23, 2013
Applicant:

Olympus Corporation, Shibuya-ku, Tokyo, JP;

Inventor:

Nobuhiro Takamizawa, Hachioji, JP;

Assignee:

OLYMPUS CORPORATION, Toyko, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G02B 21/06 (2006.01); G01N 21/64 (2006.01); G02B 21/16 (2006.01); G02B 21/18 (2006.01);
U.S. Cl.
CPC ...
G02B 21/06 (2013.01); G01N 21/648 (2013.01); G01N 21/6458 (2013.01); G02B 21/16 (2013.01); G02B 21/18 (2013.01); G02B 21/36 (2013.01); G02B 21/365 (2013.01);
Abstract

A microscope apparatus includes: an objective lens; a CCD that constructs an image of a sample S; an illumination intensity change unit for adjusting an intensity of excitation light; a sensitivity adjustment unit for adjusting a detection sensitivity by the CCD; a galvanometer mirror for changing a light focusing position of excitation light at a pupil position of the objective lens; a storage unit that stores, for each observation method, a predetermined intensity, a predetermined detection sensitivity, and the light focusing position; and a control unit that switches the observation method, reads out the intensity, the detection sensitivity, and the light focusing position according to the observation method based on a synchronization signal synchronized with a frame signal for constructing an image, and controls the illumination intensity change unit, the sensitivity adjustment unit, and the galvanometer mirror.


Find Patent Forward Citations

Takamizawa, Nobuhiro. (2017). Microscope apparatus (U.S. Patent No. 9575303). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9575303

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