The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2017
Filed:
Sep. 04, 2013
Applicant:
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Inventor:
Bernd Widzgowski, Dossenheim, DE;
Assignee:
Leica Microsystems CMS GmbH, Wetzlar, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0032 (2013.01); G02B 21/0096 (2013.01);
Abstract
The present invention relates to a confocal laser scanning microscope () having an illumination device () that comprises a laser light source () that is configured to illuminate a sample (), and a control application circuit () for the laser light source () which is configured to output a pulsed control application signal () in order to supply the laser light source (), the control application circuit () being configured so that it determines both a pulse amplitude (A) and a pulse width (W) of at least one pulse of the pulsed control application signal () as a function of at least one input variable (S).