The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2017
Filed:
Jan. 23, 2015
Tsinghua University, Beijing, CN;
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Jiang-Tao Wang, Beijing, CN;
Tian-Yi Li, Beijing, CN;
Qing-Yu Zhao, Beijing, CN;
Kai-Li Jiang, Beijing, CN;
Shou-Shan Fan, Beijing, CN;
Tsinghua University, Beijing, CN;
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;
Abstract
A vapor-condensation-assisted optical microscopy system comprises a vapor-condensation-assisted device and an optical microscope. The vapor-condensation-assisted device comprises air blowing device, a vapor producing device and a guide pipe. The vapor producing device connects the air blowing device with the guide pipe. The optical microscope comprises an observing device, an image processing device, a support frame and a stage. The stage, the guide pipe of the vapor-condensation-assisted device, the observing device, and the image processing device are fixed on the support frame. The vapor-condensation-assisted device is configured to provide a vapor to sample on the stage in application.