The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2017
Filed:
Jul. 16, 2014
Rieter CZ S.r.o., Usti nad Orlici, CZ;
Pavel Kousalik, Usti nad Orlici, CZ;
Jiri Sloupensky, Usti nad Orlici, CZ;
Rieter CZ s.r.o., Usti nad Orlici, CZ;
Abstract
A method is provided for monitoring at least one yarn quality parameter and/or a parameter of a sensor by an electronic cleaner of yarn by means of an optical detector comprising a sensor with one or two rows of individual optical elements. The individual optical elements provide at their outputs an analog signal proportional to the intensity of its irradiation, the value of which is monitored during each measurement cycle. In the first and/or the second row of optical elements of the sensor, for each monitored parameter, individual optical elements of the sensor, are selected constituting an active zone for monitoring a particular parameter. The number of the optical elements in one active zone in one row is lower than the overall number of the optical elements in the corresponding row, and the output analog signal of the individual optical elements of the corresponding active zone is included in the evaluation of the particular parameter.