The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2017
Filed:
Sep. 15, 2014
Applicant:
Cerium Laboratories, Austin, TX (US);
Inventor:
Timothy Hossain, Austin, TX (US);
Assignee:
CERIUM LABORATORIES, LLC, Austin, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/223 (2006.01); G01N 33/38 (2006.01); G01N 33/00 (2006.01);
U.S. Cl.
CPC ...
G01N 23/223 (2013.01); G01N 33/388 (2013.01); G01N 2033/0096 (2013.01);
Abstract
A method of testing for impurities includes directing an x-ray source toward a surface at an angle α relative to the plane of the surface, the surface defined by a ceramic coating over a crystalline substrate; detecting x-ray fluorescent radiation emitted from the ceramic coating at an angle θ different from the angle α and its supplementary angle; and comparing characteristics of the detected x-ray fluorescent radiation to characteristics associated with impurities.