The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2017
Filed:
Aug. 08, 2014
Omnivision Technologies, Inc., Santa Clara, CA (US);
Junzhao Lei, San Jose, CA (US);
OmniVision Technologies, Inc., Santa Clara, CA (US);
Abstract
A lens-free imaging system for detecting particles in a sample deposited on image sensor includes a fluidic chamber for holding a sample and an image sensor for imaging the sample, wherein the image sensor has a light receiving surface and a plurality of photosensitive pixels disposed underneath the light receiving surface, and wherein the fluidic chamber formed at least in part by the light receiving surface. A method for detecting particles of interest in a sample deposited on an image sensor, through lens-free imaging using the image sensor, includes (ii) generating an image of the sample, deposited on a light receiving surface of the image sensor, by illuminating the sample, and (ii) detecting the particles of interest in the image.