The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2017
Filed:
Nov. 02, 2014
Shanghai Jiao Tong University, Shanghai, CN;
Liejia Qian, Shanghai, CN;
Jingui Ma, Shanghai, CN;
Peng Yuan, Shanghai, CN;
Jing Wang, Shanghai, CN;
Yongzhi Wang, Shanhai, CN;
Guoqiang Xie, Shanghai, CN;
Dianyuan Fan, Shanghai, CN;
SHANGHAI JIAO TONG UNIVERSITY, Shanghai, CN;
Abstract
A spatiotemporally resolved far-field pulse contrast measuring device includes a plano-convex cylindrical lens, a nonlinear correlation crystal, a plano-convex imaging lens and a signal-receiving system. The signal-receiving system includes a fiber array, a photomultiplier and a digital oscilloscope. A measuring method of the device includes steps of: focusing an under-test beam in x dimension to make a focus of the under-test beam fall onto a front surface of the nonlinear correlation crystal; making a spatial correlation and a temporal correlation respectively in two transverse spatial dimensions (x-y) of the nonlinear correlation crystal by the far-field under-test beam and a sampling beam; generating a two-dimensional correlating signal by the spatiotemporal correlation; imaging the two-dimensional correlating signal by an imaging system onto a detection surface of a receiver system; and measuring the x-dimensional and y-dimensional intensity distributions of the correlating signal highly dynamically by the receiver system.