The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2017
Filed:
Jun. 03, 2016
Applicant:
Microtech Instruments, Inc., Eugene, OR (US);
Inventors:
Vladimir G. Kozlov, Eugene, OR (US);
Patrick F. Tekavec, Eugene, OR (US);
Assignee:
MICROTECH INSTRUMENTS, INC., Eugene, OR (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/08 (2006.01);
U.S. Cl.
CPC ...
G01J 5/0803 (2013.01); G01J 5/0806 (2013.01);
Abstract
A cw terahertz image beam is upconverted by a nonlinear optical process (e.g., sum- or difference-frequency generation with a near IR cw upconverting beam). The upconverted image is acquired by a near IR image detector. The bandwidths and center wavelengths of the terahertz image beam and the upconverting beam are such that wavelength filtering can be employed to permit an upconverted image beam to reach the detector while blocking or substantially attenuating the upconverting beam.