The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2017
Filed:
May. 30, 2012
Arthur Nitkowski, Ithaca, NY (US);
Arsen Hajian, Toronto, CA;
Arthur Nitkowski, Ithaca, NY (US);
Arsen Hajian, Toronto, CA;
TORNADO SPECTRAL SYSTEMS, INC., Toronto, Ontario, CA;
Abstract
A spectrometer is provided, the spectrometer having an interferometer generating an interferogram by splitting an interferometer input signal between a reference arm and a variable delay arm, and introducing a delay between the split interferometer input signals prior to interfering the split interferometer input signals. The spectrometer additionally has a controllable delay element operable to adjust the delay introduced by the interferometer and a dispersive element outputting a plurality of narrowband outputs representative of a received broadband input signal. The interferometer and dispersive element are optically connected to output a plurality of narrowband interferograms representative of a spectra of a spectrometer input signal received by the spectrometer, and the plurality of narrowband interferograms are received by a detector array for analysis.