The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2017

Filed:

Mar. 23, 2015
Applicant:

Ngk Insulators, Ltd., Aichi, JP;

Inventors:

Jungo Kondo, Miyoshi, JP;

Yuichi Iwata, Nagoya, JP;

Tetsuya Ejiri, Kasugai, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/04 (2006.01); G01N 21/3581 (2014.01); G01J 3/02 (2006.01); G01N 21/3586 (2014.01); G01J 3/42 (2006.01); G02F 1/03 (2006.01);
U.S. Cl.
CPC ...
G01J 1/0407 (2013.01); G01J 3/021 (2013.01); G01J 3/42 (2013.01); G01N 21/3581 (2013.01); G01N 21/3586 (2013.01); G02F 1/03 (2013.01);
Abstract

Provided a terahertz-wave detection element with high spatial resolution and suppressing a crack occurrence. A method of manufacturing the detection element capable of detecting a spatial intensity distribution of a terahertz wave includes: a step of forming an oxide layer on one main surface of a first substrate consisting of an electro-optic crystal; a step of joining the one main surface of the first substrate and a second substrate by an adhesive consisting; a step of thinning the first substrate of a joined body, to a thickness of 1-30 μm by polishing the first substrate; and a step of obtaining a large number of terahertz-wave detection elements by cutting the joined body. The oxide layer is formed such that the first substrate becomes convex to a side of the one main surface by causing a tensile stress to act on it.


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