The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2017

Filed:

Jan. 21, 2014
Applicant:

Axsun Technologies Llc, Billerica, MA (US);

Inventors:

Bartley C. Johnson, North Andover, MA (US);

Walid Atia, Lexington, MA (US);

Mark E. Kuznetsov, Lexington, MA (US);

Dale C. Flanders, Lexington, MA (US);

Assignee:

Axsun Technologies LLC, Billerica, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); H01S 3/106 (2006.01); H01S 3/23 (2006.01); H01S 5/14 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02091 (2013.01); G01B 9/02004 (2013.01); G01B 9/02007 (2013.01); G01B 9/02069 (2013.01); H01S 3/1062 (2013.01); H01S 3/2383 (2013.01); H01S 5/141 (2013.01);
Abstract

An optical coherence analysis system comprising: a first swept source that generates a first optical signal that is tuned over a first spectral scan band, a second swept source that generates a second optical signal that is tuned over a second spectral scan band, a combiner for combining the first optical signal and the second optical signal to form a combined optical signal, an interferometer for dividing the combined optical signal between a reference arm leading to a reference reflector and a sample arm leading to a sample, and a detector system for detecting an interference signal generated from the combined optical signal from the reference arm and from the sample arm.


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