The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2017
Filed:
Apr. 20, 2012
Applicants:
Eriko Maeda, Okazaki, JP;
Takehito Kimata, Kariya, JP;
Inventors:
Eriko Maeda, Okazaki, JP;
Takehito Kimata, Kariya, JP;
Assignee:
DENSO CORPORATION, Kariya, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F02D 41/14 (2006.01); F02D 41/24 (2006.01); G01N 15/06 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
F02D 41/1466 (2013.01); F02D 41/2432 (2013.01); F02D 41/2474 (2013.01); G01N 15/0656 (2013.01); G01N 35/00693 (2013.01);
Abstract
An apparatus for detecting particulate and a correction method of the apparatus for detecting particulate matter that detects particulate matter within a gas to be measured are provided. The correction method corrects the individual differences inevitably occurring during the manufacturing process of particulate matter detection sensors. The apparatus for detecting particulate matter includes an applied voltage correction means. The applied voltage correction means applies correction information acquired by the correction method to detection control.