The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2017
Filed:
Oct. 17, 2012
Applicant:
Shanghai Qy Biotech Co., Ltd., Shanghai, CN;
Inventors:
Rui Shi, Shanghai, CN;
Bochun Huang, Shanghai, CN;
Assignee:
SHANGHAI QY BIOTECH CP., LTD., Shanghai, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C07H 21/04 (2006.01); C12Q 1/68 (2006.01);
U.S. Cl.
CPC ...
C12Q 1/6818 (2013.01); C12Q 1/6869 (2013.01); C12Q 1/6876 (2013.01);
Abstract
A method for detecting variation of gene based on fluorescence quenching quantification comprises: performing single base extension at a specific site of a gene to be detected with marked probes and marked dideoxyribonucleotide triphosphate; detecting fluorescence quenching values, and determining SNP of the gene to be detected. The present invention also provides an oligonucleotide probe for the method.
Shi, Rui. (2017). Method for detecting variation of gene for non-diagnostic purpose based on fluorescence quenching and probe thereof (U.S. Patent No. 9574227). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9574227
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile