The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2017

Filed:

Oct. 06, 2015
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventor:

Masayuki Ukishima, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 2/21 (2006.01); B41J 2/045 (2006.01); B41J 2/165 (2006.01); B41J 29/393 (2006.01);
U.S. Cl.
CPC ...
B41J 2/2142 (2013.01); B41J 2/0451 (2013.01); B41J 2/04558 (2013.01); B41J 2/16579 (2013.01); B41J 2/2132 (2013.01); B41J 2/2146 (2013.01); B41J 29/393 (2013.01); B41J 2029/3935 (2013.01);
Abstract

The test image is formed in accordance with input data in which a plurality of recording elements selected every N (an integer of 1 or more) pieces in a projected recording element group is indicated as a first recording element and a recording element that is not selected as the first recording element is indicated as a second recording element, the input data allowing: a first-stage pattern to be formed in a recording area of the second recording element in accordance with a second input gradation value; a recording position in the second direction to be sequentially changed; and the first recording element and the second recording element to be sequentially switched to form a second-stage pattern to an (N+1)-th-stage pattern.


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