The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2017
Filed:
Apr. 11, 2012
Pablo Artal Soriano, Murcia, ES;
Guillermo Perez Sanchez, Murcia, ES;
Juan Manuel Bueno Garcia, Murcia, ES;
Harilaos Ginis, Murcia, ES;
Pablo Artal Soriano, Murcia, ES;
Guillermo Perez Sanchez, Murcia, ES;
Juan Manuel Bueno Garcia, Murcia, ES;
Harilaos Ginis, Murcia, ES;
UNIVERSIDAD DE MURCIA, Murcia, ES;
Abstract
The present invention relates to a method for measuring ocular scattering, comprising the steps of: sequentially projecting images from an extensive light source, corresponding to different visual angles, onto the retina; recording the output light in a camera or detector once it has passed through the eye twice; calculating the intensity at the center of each recorded image; calculating the PSF for each angle from the previous intensities; and calculating the average of the value of the PSF between the angles. The invention also relates to a system for carrying out said method. The invention can be used to measure the intensity of the scattered light in an objective manner.