The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2017

Filed:

Dec. 18, 2012
Applicant:

Kabushiki Kaisha Topcon, Itabashi-ku, Tokyo-to, JP;

Inventors:

Kaoru Kumagai, Tokyo-to, JP;

Kazuki Osaragi, Tokyo-to, JP;

Tetsuji Anai, Tokyo-to, JP;

Fumio Ohtomo, Asaka, JP;

Assignee:

Kabushiki Kaisha TOPCON, Tokyo-to, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G01C 15/00 (2006.01); G02B 23/00 (2006.01);
U.S. Cl.
CPC ...
H04N 7/18 (2013.01); G01C 15/002 (2013.01); G02B 23/145 (2013.01);
Abstract

A surveying apparatus comprises an observation optical system having an image sensor for outputting a digital image signal and a zoom optical system, a reference-pattern projection optical system for making a reference pattern enter the observation optical system in an infinity state and for forming an image on the image sensor, a rotation mechanism capable of rotating in two directions, a horizontal angle detector and a vertical angle detector for detecting a horizontal angle and a vertical angle of rotation in the two directions of the rotation mechanism, and an arithmetic control unit. The arithmetic control unit measures the horizontal angle and the vertical angle of a sighting point based on detection results of the horizontal angle detector and the vertical angle detector and based on a difference between the reference pattern on the image sensor and the sighting point of the observation optical system.


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