The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2017

Filed:

Dec. 04, 2015
Applicant:

Joseph Pernyeszi, Scotts Valley, CA (US);

Inventor:

Joseph Pernyeszi, Scotts Valley, CA (US);

Assignee:

General Electronics Applications, Inc., Scotts Valley, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/94 (2006.01); H01L 29/06 (2006.01); H01L 29/78 (2006.01); H01L 29/08 (2006.01); H01L 29/10 (2006.01); H01L 21/762 (2006.01);
U.S. Cl.
CPC ...
H01L 29/0634 (2013.01); H01L 29/0692 (2013.01); H01L 29/0886 (2013.01); H01L 29/7816 (2013.01); H01L 21/76237 (2013.01); H01L 29/1095 (2013.01);
Abstract

A high voltage DMOS half-bridge output for various DC to DC converters on a monolithic, junction isolated wafer is presented. A high-side lateral DMOS transistor is based on the epi extension diffusion and a five layer RESURF structure. The five layers are made possible by the epi extension diffusion which is formed by a suitable n-type dopant diffused into a p-type substrate and it is the same polarity as the epi. The five layers, starting with the p-type substrate, are the substrate, the n-type epi extension diffusion, a p-type buried layer, the n-type epi and a shallow p-type layer at the top of the epi. The epi extension is also used to shape the electric field by a specific lateral distribution and make the lateral and vertical electric fields to be the smoothest to avoid electric field induced breakdown in the silicon or oxide layers above the silicon.


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