The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2017
Filed:
Mar. 12, 2014
Applicant:
1st Detect Corporation, Austin, TX (US);
Inventors:
Assignee:
1ST DETECT CORPORATION, Austin, TX (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); H01J 49/10 (2006.01); H01J 49/42 (2006.01); H01J 49/14 (2006.01); H01J 49/16 (2006.01);
U.S. Cl.
CPC ...
H01J 49/107 (2013.01); H01J 49/147 (2013.01); H01J 49/162 (2013.01); H01J 49/4215 (2013.01); H01J 49/42 (2013.01);
Abstract
A mass spectrometer is disclosed. The mass spectrometer may include an ion trap configured to trap and analyze an ionized sample. A first aperture may be provided having a first diameter, and a second aperture may be provided having a second diameter. The first aperture may be configured to receive electrons for the purpose of ionizing sample ions within the ion trap. The second aperture may be configured to receive photons for the purpose of ionizing sample ions within the ion trap.
Riaz, Abrar. (2017). Ionization within ion trap using photoionization and electron ionization (U.S. Patent No. 9570282). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9570282
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile