The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2017

Filed:

Jan. 15, 2014
Applicant:

Nitto Denko Corporation, Ibaraki-shi, Osaka, JP;

Inventors:

Kazuaki Sasa, Ibaraki, JP;

Yusuke Yamamoto, Ibaraki, JP;

Hironobu Machinaga, Ibaraki, JP;

Assignee:

NITTO DENKO CORPORATION, Ibaraki-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B32B 15/08 (2006.01); H01B 1/08 (2006.01); C23C 14/58 (2006.01); C23C 14/34 (2006.01); C23C 14/08 (2006.01); H01L 31/18 (2006.01);
U.S. Cl.
CPC ...
H01B 1/08 (2013.01); C23C 14/086 (2013.01); C23C 14/34 (2013.01); C23C 14/5806 (2013.01); H01L 31/1884 (2013.01); Y02E 10/50 (2013.01); Y10T 428/265 (2015.01);
Abstract

The transparent conductive film of the invention includes a transparent conductive coating provided on at least one surface of an organic polymer film substrate, wherein the transparent conductive coating is a crystalline coating of an indium-based complex oxide having a tetravalent metal oxide content of 7 to 15% by weight as calculated by the formula {(the amount of the tetravalent metal element oxide)/(the amount of the tetravalent metal element oxide+the amount of indium oxide)}×100 (%), has a thickness of 10 to 40 nm and a specific resistance of 1.3×10to 2.8×10Ω·cm, has main X-ray diffraction peaks corresponding to (222) and (440) planes, and has a ratio (I/I) of (440) peak intensity to (222) peak intensity of less than 0.2. The transparent conductive film of the invention has a crystalline thin coating with a low level of specific resistance and surface resistance.


Find Patent Forward Citations

Loading…