The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2017

Filed:

Aug. 23, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Arup Acharya, Yorktown Heights, NY (US);

Kirk A. Beaty, Yorktown Heights, NY (US);

Puneet Jain, Yorktown Heights, NY (US);

Justin G. Manweiler, Yorktown Heights, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 15/06 (2011.01); G06T 7/00 (2006.01); G11B 27/10 (2006.01); G06T 17/00 (2006.01); G06K 9/00 (2006.01); G11B 27/28 (2006.01);
U.S. Cl.
CPC ...
G11B 27/10 (2013.01); G06K 9/00201 (2013.01); G06K 9/00664 (2013.01); G06T 7/0024 (2013.01); G06T 7/0042 (2013.01); G06T 7/0071 (2013.01); G06T 17/00 (2013.01); G11B 27/28 (2013.01); G06T 2200/04 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/30196 (2013.01); G06T 2207/30221 (2013.01); G06T 2207/30244 (2013.01);
Abstract

A method for clustering images includes acquiring initial image data including a scene of interest. A 3D model is constructed of the scene of interest based on the acquired initial image data. Additional image data including the scene of interest is acquired. The additional image data is fitted to the 3D model. A line-of-sight of the additional image data is estimated based on the fitting to the 3D model. The additional image data is clustered according to the estimated line-of-sight.


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