The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2017

Filed:

Oct. 31, 2014
Applicant:

The Nielsen Company (Us), Llc, Schaumburg, IL (US);

Inventors:

Wei Xie, Woodridge, IL (US);

Michael Allen Bivins, San Francisco, CA (US);

Steve Jones, Oxford, GB;

Kevin Keqiang Deng, Safety Harbor, FL (US);

Brian Schiller, St. Louis, MO (US);

Jonathan Sullivan, Natick, MA (US);

Alejandro Terrazas, Santa Cruz, CA (US);

Michael Sheppard, Brooklyn, NY (US);

Assignee:

The Nielsen Company (US), LLC, New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2006.01); G06K 9/64 (2006.01); G06K 9/62 (2006.01); G06K 9/00 (2006.01); G06Q 30/02 (2012.01);
U.S. Cl.
CPC ...
G06K 9/6202 (2013.01); G06K 9/00691 (2013.01); G06Q 30/0201 (2013.01); G06T 7/0044 (2013.01); G06K 2009/6213 (2013.01); G06K 2209/25 (2013.01); G06K 2209/27 (2013.01); G06T 2207/10004 (2013.01);
Abstract

Example methods, apparatus, systems to perform context-based image recognition for consumer market research are disclosed. Disclosed example methods include comparing a first subset of feature points in a first region of interest of a reference image with a first subset of feature points of a first image residing within a first region corresponding spatially to the first region of interest and located at a first location in the first image to determine a first match value. Disclosed example methods also include, in response to determining the first match value satisfies a first threshold, comparing a second subset of feature points in a second region of interest of the reference image with a second subset of the feature points of the first image residing within a second region of the first image corresponding spatially to the second region of interest to determine a second match value.


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