The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2017

Filed:

Nov. 05, 2013
Applicant:

California Institute of Technology, Pasadena, CA (US);

Inventors:

Benjamin Judkewitz, Berlin, DE;

Guoan Zheng, Vernon, CT (US);

Samuel Yang, San Dimas, CA (US);

Seung Ah Lee, Pasadena, CA (US);

Shuo Pang, Pasadena, CA (US);

Changhuei Yang, Alhambra, CA (US);

Ying Min Wang, Singapore, SG;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01N 21/03 (2006.01); G01N 21/25 (2006.01); G01N 21/27 (2006.01); C12M 1/34 (2006.01); B01L 3/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00624 (2013.01); B01L 3/508 (2013.01); C12M 41/36 (2013.01); G01N 21/03 (2013.01); G01N 21/25 (2013.01); G01N 21/272 (2013.01); B01L 3/502792 (2013.01); B01L 2300/0654 (2013.01); G01N 2201/10 (2013.01);
Abstract

Methods of rapid distinction between growing cells and debris, which determine a time-lapse movie of specimen images, track features of each entity, and categorize each entity as growing cells or debris.


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