The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9569655 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 14, 2017

Filed:

Apr. 25, 2012
Applicant:

Jack Harper, Evergreen, CO (US);

Inventor:

Jack Harper, Evergreen, CO (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 7/08 (2006.01); G06K 9/20 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00067 (2013.01); G06K 7/08 (2013.01); G06K 7/081 (2013.01); G06K 9/0002 (2013.01); G06K 9/00006 (2013.01); G06K 9/00013 (2013.01); G06K 9/209 (2013.01); G06K 9/6231 (2013.01);
Abstract

Techniques are disclosed herein for artificial intelligence machine learning to increase collection of digital livescan fingerprints. According to certain embodiments of the invention, processing parameters can be automatically machine-optimized for processing scan images of fingerprints (and other areas) to increase the amount of detected minutia. The processing parameters can alter and change over time to reflect historical successes and failures of particular optimizations. This allows a fingerprint collection device to learn over time and become more accurate (i.e., more successful at detecting minutia). Additionally, the techniques further include receiving input from a user regarding physical traits of a scanned subject, to further customize the processing parameter optimization. Various other features are provided herein.


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Harper, Jack. (2017). Digital voting logic for manufacturable finger asperity wafer-scale solid state palm print scan devices (U.S. Patent No. 9569655). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9569655

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